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Structural investigation of CoMnGe combinatorial epitaxial thin films using microfocused synchrotron X-ray
Yong S. Chu, Andrei Tkachuk, Stefan Vogt, Petr Ilinski, Donald A. Walko, Derrick C. Mancini, Eric M. Dufresne, Liang He, Frank TsuiVolume:
223
Year:
2004
Language:
english
Pages:
8
DOI:
10.1016/s0169-4332(03)00894-8
File:
PDF, 343 KB
english, 2004