Raman spectroscopy of Si1 − x − yGexCy layers obtained by...

Raman spectroscopy of Si1 − x − yGexCy layers obtained by pulsed laser induced epitaxy

E. Finkman, J. Boulmer, P. Boucaud, C. Guedj, D. Bouchier, K. Nugent, S. Prawer
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Volume:
106
Year:
1996
Language:
english
Pages:
8
DOI:
10.1016/s0169-4332(96)00415-1
File:
PDF, 524 KB
english, 1996
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