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Investigation of the characteristics of GIDL current in 90nm CMOS technology
C. Hai-feng, H. Yue, M. Xiao-hua, Z. Jin-cheng, L. Kang, C. Yan-rong, Z. Jin-feng, Z. Peng-juYear:
2006
Language:
english
DOI:
10.1088/1009-1963/15/3/034
File:
PDF, 270 KB
english, 2006