Spatially resolved characterization of superconducting...

Applied Surface Science 1996 Vol. 106; Iss. none

Spatially resolved characterization of superconducting films and cryoelectronic devices by means of low temperature scanning laser microscope

A.G. Sivakov, A.P. Zhuravel', O.G. Turutanov, I.M. Dmitrenko
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Volume:
106
Year:
1996
Language:
english
Pages:
6
DOI:
10.1016/s0169-4332(96)00445-x
File:
PDF, 607 KB
english, 1996
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