In situ monitoring of InAs-on-GaAs quantum dot formation in...

Applied Surface Science 1996 Vol. 107; Iss. none

In situ monitoring of InAs-on-GaAs quantum dot formation in MOVPE by reflectance-anisotropy-spectroscopy and ellipsometry

E. Steimetz, J.-T. Zettler, F. Schienle, T. Trepk, T. Wethkamp, W. Richter, I. Sieber
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Volume:
107
Year:
1996
Language:
english
Pages:
9
DOI:
10.1016/s0169-4332(96)00487-4
File:
PDF, 746 KB
english, 1996
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