Defects in Cu and Ag overlayers epitaxially grown on a...

Applied Surface Science 1997 Vol. 116; Iss. none

Defects in Cu and Ag overlayers epitaxially grown on a Ru(0001) substrate studied by slow positrons

C. Hahn, R. Krause-Rehberg, M. Heiler, H. Wolter, H. Neddermeyer, K. Wandelt, A. Otto
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Volume:
116
Year:
1997
Language:
english
Pages:
6
DOI:
10.1016/s0169-4332(96)01058-6
File:
PDF, 454 KB
english, 1997
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