Application of maximum-likelihood estimation in optical...

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Application of maximum-likelihood estimation in optical coherence tomography for nanometer-class thickness estimation

R. Raghavachari, R. Liang, T. J. Pfefer, J. Huang, Q. Yuan, P. Tankam, E. Clarkson, M. Kupinski, H. B. Hindman, J. V. Aquavella, J. P. Rolland
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Language:
english
DOI:
10.1117/12.2083160
File:
PDF, 1.36 MB
english
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