Application of maximum-likelihood estimation in optical coherence tomography for nanometer-class thickness estimation
R. Raghavachari, R. Liang, T. J. Pfefer, J. Huang, Q. Yuan, P. Tankam, E. Clarkson, M. Kupinski, H. B. Hindman, J. V. Aquavella, J. P. RollandLanguage:
english
DOI:
10.1117/12.2083160
File:
PDF, 1.36 MB
english