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Structure determination of the indium induced Si(001)-(4 × 3) reconstruction by surface X-ray diffraction and scanning tunneling microscopy
O. Bunk, G. Falkenberg, L. Seehofer, J.H. Zeysing, R.L. Johnson, M. Nielsen, R. Feidenhans'l, E. LandemarkVolume:
123-124
Year:
1998
Language:
english
Pages:
7
DOI:
10.1016/s0169-4332(97)00472-8
File:
PDF, 545 KB
english, 1998