Atomic and chemical resolution in scanning force microscopy...

Applied Surface Science 1999 Vol. 141; Iss. 3-4

Atomic and chemical resolution in scanning force microscopy on ionic surfaces

Alexander I Livshits, Alexander L Shluger
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Volume:
141
Year:
1999
Language:
english
Pages:
13
DOI:
10.1016/s0169-4332(98)00513-3
File:
PDF, 1.14 MB
english, 1999
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