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The structure of TiOx thin film studied by Raman spectroscopy and XRD
Wei-Xing Xu, Shu Zhu, Xian-Cai Fu, Qiang ChenVolume:
148
Year:
1999
Language:
english
Pages:
10
DOI:
10.1016/s0169-4332(98)00589-3
File:
PDF, 296 KB
english, 1999