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Determination of thin film growth mechanisms of deposited metal oxides by a combined use of ISS and XPS
V.M. Jiménez, J.P. Espinós, A.R. González-ElipeVolume:
141
Year:
1999
Language:
english
Pages:
7
DOI:
10.1016/s0169-4332(98)00612-6
File:
PDF, 272 KB
english, 1999