STM study of the Te/Si(100) interface
F Wiame, G Mathot, S Sivananthan, S Rujirawat, R Caudano, R SporkenVolume:
142
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0169-4332(98)00686-2
File:
PDF, 1008 KB
english, 1999