![](/img/cover-not-exists.png)
Accurate topographic images using a measuring atomic force microscope
S Gonda, T Doi, T Kurosawa, Y Tanimura, N Hisata, T Yamagishi, H Fujimoto, H YukawaVolume:
144-145
Year:
1999
Language:
english
Pages:
5
DOI:
10.1016/s0169-4332(98)00851-4
File:
PDF, 1.59 MB
english, 1999