Holographic study of non destructive thermal stress in...

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Holographic study of non destructive thermal stress in multidielectric films coated for 10.6 mu m

P. Baulaigue, D. Aubert, H. Blancher, R. Occelli, J. M. Moynault
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Year:
1994
Language:
english
DOI:
10.1088/0150-536X/25/6/001
File:
PDF, 255 KB
english, 1994
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