![](/img/cover-not-exists.png)
On properties of boundaries and electron conductivity in mesoscopic polycrystalline silicon films for memory devices
G. P. Berman, G. D. Doolen, R. Mainieri, J. Rehacek, D. K. Campbell, V. A. Luchnikov, K. E. NagaevYear:
1998
Language:
english
DOI:
10.1088/0268-1242/13/8A/012
File:
PDF, 211 KB
english, 1998