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Thermal resistance measurement of GaAs MESFETs by means of photocurrent spectrum analysis and comparison with simulations
P. Regoliosi, A. D. Carlo, A. Reale, P. Lugli, M. Peroni, C. Lanzieri, A. CetronioYear:
2005
Language:
english
DOI:
10.1088/0268-1242/20/2/005
File:
PDF, 199 KB
english, 2005