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Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM
H Hosoi, K Sueoka, K Hayakawa, K MukasaVolume:
157
Year:
2000
Language:
english
Pages:
4
DOI:
10.1016/s0169-4332(99)00529-2
File:
PDF, 335 KB
english, 2000