Kelvin probe force microscopy in ultra high vacuum using...

Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces

Ch Sommerhalter, Th Glatzel, Th.W Matthes, A Jäger-Waldau, M.Ch Lux-Steiner
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Volume:
157
Year:
2000
Language:
english
Pages:
6
DOI:
10.1016/s0169-4332(99)00537-1
File:
PDF, 227 KB
english, 2000
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