Atomic resolution imaging using the electric double layer...

Atomic resolution imaging using the electric double layer technique: friction vs. height contrast mechanisms

I.Yu Sokolov, G.S Henderson
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Volume:
157
Year:
2000
Language:
english
Pages:
6
DOI:
10.1016/s0169-4332(99)00543-7
File:
PDF, 1.13 MB
english, 2000
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