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Measurements and analysis of surface potential change during wear of single-crystal silicon (100) at ultralow loads using Kelvin probe microscopy
Bharat Bhushan, Anton V GoldadeVolume:
157
Year:
2000
Language:
english
Pages:
9
DOI:
10.1016/s0169-4332(99)00553-x
File:
PDF, 468 KB
english, 2000