Quantitative XPS analysis of silica-supported Cu–Co oxides

Applied Surface Science 2000 Vol. 157; Iss. 3

Quantitative XPS analysis of silica-supported Cu–Co oxides

Deborah V Cesar, Carlos A Peréz, Martin Schmal, Vera Maria M Salim
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Volume:
157
Year:
2000
Language:
english
Pages:
8
DOI:
10.1016/s0169-4332(99)00568-1
File:
PDF, 333 KB
english, 2000
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