Study of low frequency noise in advanced SiGe:C...

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Study of low frequency noise in advanced SiGe:C heterojunction bipolar transistors

M. Seif, F. Pascal, B. Sagnes, A. Hoffmann, S. Haendler, P. Chevalier, D. Gloria
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Year:
2014
Language:
english
DOI:
10.1109/ESSDERC.2014.6948838
File:
PDF, 3.35 MB
english, 2014
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