Total Reflection X-Ray Fluorescence Analysis Excited by...

Total Reflection X-Ray Fluorescence Analysis Excited by Synchrotron Radiation (SR-TXRF): Variation of Excitation Conditions and Sample Geometries

R. Görgl, P. Wobrauschek, P. Kregsamer, Ch. Streli, M. Haller, A. Knöchel, M. Radtke
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Volume:
26
Year:
1997
Language:
english
Pages:
6
DOI:
10.1002/(sici)1097-4539(199707)26:43.0.co;2-0
File:
PDF, 341 KB
english, 1997
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