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Correlation between microstructural and optical properties of silicon thin films grown onto porous alumina by plasma–enhanced CVD method
F. Laatara, M. Hassen, N. Maaloul, K. Khirouni, H. EzzaouiaYear:
2015
Language:
english
DOI:
10.1016/j.jallcom.2015.06.251
File:
PDF, 13.24 MB
english, 2015