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Thermally stimulated characterization of shallow traps in the SiC/Si heterojunction
V. S. Lysenko, I. P. Tyagulski, Y. V. Gomeniuk, I. N. Osiyuk, I. I. TkachYear:
1998
Language:
english
DOI:
10.1088/0022-3727/31/13/001
File:
PDF, 101 KB
english, 1998