Genetic algorithm using independent component analysis in x-ray reflectivity curve fitting of periodic layer structures
J. Tiilikainen, V. Bosund, J. Tilli, J. Sormunen, M. Mattila, T. Hakkarainen, H. LipsanenYear:
2007
Language:
english
DOI:
10.1088/0022-3727/40/19/033
File:
PDF, 234 KB
english, 2007