FTIR Characterization of Fluorine Doped Silicon Dioxide...

  • Main
  • FTIR Characterization of Fluorine Doped...

FTIR Characterization of Fluorine Doped Silicon Dioxide Thin Films Deposited by Plasma Enhanced Chemical Vapor Deposition

W. Peng-fei, D. Shi-jin, Z. Wei, Z. Jian-yun, W. Ji-tao, L. W. Wei
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2000
Language:
english
DOI:
10.1088/0256-307X/17/12/020
File:
PDF, 329 KB
english, 2000
Conversion to is in progress
Conversion to is failed