Dependence of Intrinsic Defects in ZnO Films on Oxygen...

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Dependence of Intrinsic Defects in ZnO Films on Oxygen Fraction Studied by Positron Annihilation

P. Cheng-xiao, W. Hui-min, Y. Xiao-jie, Y. Bang-jiao, C. Bin, Z. Xian-yi, H. Rong-dian
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Year:
2006
Language:
english
DOI:
10.1088/0256-307X/23/2/060
File:
PDF, 247 KB
english, 2006
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