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A ballistic electron emission microscopy study of barrier height inhomogeneities introduced in Au/III-V semiconductor Schottky barrier contacts by chemical pretreatments
G. M. Vanalme, L. Goubert, R. L. V. Meirhaeghe, F. Cardon, P. V. DaeleYear:
1999
Language:
english
DOI:
10.1088/0268-1242/14/9/321
File:
PDF, 169 KB
english, 1999