IntriX: a numerical model for electron probe analysis at high depth resolution. Part II—tests and confrontation with experiments
P.-F. Staub, P. Jonnard, F. Vergand, J. Thirion, and C. BonnelleVolume:
27
Year:
1998
Language:
english
Pages:
9
DOI:
10.1002/(sici)1097-4539(199801/02)27:13.0.co;2-4
File:
PDF, 565 KB
english, 1998