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X-Ray Investigation of the Degradation of Zn-Doped GaInAsP/InP Heterointerface
P. A. Aleksandrov, N. E. Belova, S. A. Nazarov, A. A. Nefedov, S. S. Fanchenko, V. A. Chaplanov, D. Yu. SchumilovYear:
1998
Language:
english
DOI:
10.1142/S0218625X98000542
File:
PDF, 297 KB
english, 1998