First-Principles Simulation on Thickness Dependence of...

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First-Principles Simulation on Thickness Dependence of Piezoresistance Effect in Silicon Nanosheets

K. Nakamura, T. Toriyama, S. Sugiyama
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Year:
2010
Language:
english
DOI:
10.1143/JJAP.49.06GH01
File:
PDF, 343 KB
english, 2010
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