Measuring Lattice Strain in Three Dimensions through Electron Microscopy
B. Goris, J. De Beenhouwer, A. De Backer, D. Zanaga, K. J. Batenburg, A. Sánchez-iglesias, L. M. Liz-marzán, S. Van Aert, S. Bals, J. Sijbers, G. Van TendelooYear:
2015
Language:
english
DOI:
10.1021/acs.nanolett.5b03008
File:
PDF, 3.68 MB
english, 2015