Microcontroller based double beam modulation system for atomic scattering experiments
O'Neill, R W, Greenwood, J B, Gradziel, M L, Williams, I DVolume:
12
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/12/9/314
Date:
September, 2001
File:
PDF, 111 KB
english, 2001