Data acquisition and analysis procedures for...

Nanotechnology 2009 / 07 Vol. 20; Iss. 26

Data acquisition and analysis procedures for high-resolution atomic force microscopy in three dimensions

Albers, Boris J, Schwendemann, Todd C, Baykara, Mehmet Z, Pilet, Nicolas, Liebmann, Marcus, Altman, Eric I, Schwarz, Udo D
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
20
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/20/26/264002
Date:
July, 2009
File:
PDF, 2.73 MB
english, 2009
Conversion to is in progress
Conversion to is failed