New method for fast morphological characterization of...

New method for fast morphological characterization of organic polycrystalline films by polarized optical microscopy

He, Xiao-Chuan, Yang, Jian-Bing, Yan, Dong-Hang, Weng, Yu-Xiang
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Volume:
24
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/24/7/076803
Date:
July, 2015
File:
PDF, 1.55 MB
english, 2015
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