Nonuniformity Analysis of a 65-kpixel CMOS SPAD Imager

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IEEE Transactions on Electron Devices 2015

Nonuniformity Analysis of a 65-kpixel CMOS SPAD Imager

Antolovic, Ivan Michel, Burri, Samuel, Bruschini, Claudio, Hoebe, Ron, Charbon, Edoardo
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Year:
2015
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2458295
File:
PDF, 2.22 MB
english, 2015
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