Impact Ionization Coefficients in 4H-SiC Toward...

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IEEE Transactions on Electron Devices 2015

Impact Ionization Coefficients in 4H-SiC Toward Ultrahigh-Voltage Power Devices

Niwa, Hiroki, Suda, Jun, Kimoto, Tsunenobu
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Year:
2015
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2466445
File:
PDF, 2.43 MB
english, 2015
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