Substrate Current due to Impact Ionization in MOS-FET

Substrate Current due to Impact Ionization in MOS-FET

Kamata, Takao, Tanabashi, Kyozi, Kobayashi, Keizo
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Volume:
15
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.15.1127
Date:
June, 1976
File:
PDF, 678 KB
1976
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