Correlation between Crystal Perfection and Reflection...

Japanese Journal of Applied Physics 1978 / 4 Vol. 17; Iss. 4

Correlation between Crystal Perfection and Reflection Intensity of Analyzer Crystal for X-Ray Spectra

Asada, Eiichi, Takiguchi, Toshimichi
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Volume:
17
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.17.687
Date:
April, 1978
File:
PDF, 682 KB
1978
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