Surface Microtopography and Compositional Change of...

Japanese Journal of Applied Physics 1985 / 8 Vol. 24; Iss. Part 1, No

Surface Microtopography and Compositional Change of Cesium-Ion-Bombarded Semiconductor Surfaces

Homma, Yoshikazu, Okamoto, Hamao, Ishii, Yoshikazu
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Volume:
24
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.24.934
Date:
August, 1985
File:
PDF, 1.98 MB
1985
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