High Resolution Z-Contrast Observation of GaAs/Si...

Japanese Journal of Applied Physics 1992 / 12 Vol. 31; Iss. Part 2, No

High Resolution Z-Contrast Observation of GaAs/Si Hetero-Interfaces through Scanning Transmission Electron Microscope

Takasuka, Eiryo, Asai, Koyu, Fujita, Kazuhisa, Chisholm, Matthew F., Pennycook, Stephen J.
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Volume:
31
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.31.L1788
Date:
December, 1992
File:
PDF, 1.08 MB
1992
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