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Application of Atomic Force Microscopy to the Study of Size Fluctuation in E-Beam Patterned Quantum Wire Structures
Notomi, Masaya, Nakao, Masashi, Tamamura, ToshiakiVolume:
32
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.2973
Date:
June, 1993
File:
PDF, 1.88 MB
1993