![](/img/cover-not-exists.png)
Deep Level Transient Spectroscopy Characterization of Defects Introduced in n-GaAs after Alpha Irradiation at 15 K
Goodman, S. A., Auret, F. D.Volume:
32
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.L1120
Date:
August, 1993
File:
PDF, 584 KB
1993