Possibility of Analyzing the Type of Impurities in...

Japanese Journal of Applied Physics 1994 / 6 Vol. 33; Iss. Part 2, No

Possibility of Analyzing the Type of Impurities in Semiconductors by Application of Bistability in Luminescence

Ullrich, Bruno, Misawa, Kazuhiko, Kobayashi, Takayoshi, Kazlauskas, Arunas, Cong, Hoan Nguyen, Chartier, Pierre
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Volume:
33
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.33.L776
Date:
June, 1994
File:
PDF, 598 KB
1994
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