Post-Stress Interface-Trap Generation in P-Channel Metal-Oxide-Semicondutor Field-Effect-Transistors after Hot-Electron Stress
Tse, Man-Siu, Wong, Terence Kin-Shun, Ang, Chew-HoeVolume:
35
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.35.2095
Date:
April, 1996
File:
PDF, 1.12 MB
1996