Suppression of Boron Penetration in B F 2+ -Implanted Poly-Si Gate
Chao, Tien Sheng, Chu, Chih-Hsun, Wang, Chuan Fu, Ho, Kuai Junz, Lei, Tan. Fu, Lee, Chung LenVolume:
35
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.35.6003
Date:
December, 1996
File:
PDF, 949 KB
1996