Evaluation of Hole Traps in 10-MeV Proton-Irradiated p-Type Silicon from Hall-Effect Measurements
Matsuura, Hideharu, Uchida, Yoshitsugu, Hisamatsu, Tadashi, Matsuda, SumioVolume:
37
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.37.6034
Date:
November, 1998
File:
PDF, 1023 KB
1998