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Influence of Interface Structure on Chemical Etching Process for Air Gap of Microelectromechanical System Based on Surface Micromachining
Yoon, Young Soo, Kim, Joon Han, Polla, Dennis. L., Shin, Young HwaVolume:
37
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.37.7129
Date:
December, 1998
File:
PDF, 2.06 MB
1998