Evaluation of Effective Recombination Velocity Related to...

Japanese Journal of Applied Physics 2002 / 3 Vol. 41; Iss. Part 1, No

Evaluation of Effective Recombination Velocity Related to the Potential Barrier in n/n + Silicon Epitaxial Wafers

Takahashi, Hidenori, Maekawa, Takao
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Volume:
41
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.41.1214
Date:
March, 2002
File:
PDF, 106 KB
english, 2002
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